Associate
Daniel Meehan is a litigation and arbitration associate at Stein Ray LLP. Mr. Meehan focuses his practice on complex construction litigation matters, including design-defect and delay-related claims. Prior to joining Stein Ray, Mr. Meehan practiced in commercial litigation, insurance coverage litigation, and general civil defense with firms in Chicago. Mr. Meehan is admitted to practice in Illinois and the United States District Court for the Northern District of Illinois.
Mr. Meehan received his Juris Doctor, cum laude, from the University of Illinois College of Law in 2020. Mr. Meehan graduated with a Bachelor of Arts from the University of Missouri in 2017, majoring in Psychology and minoring in Philosophy, Sociology, and Spanish.
